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Test Definitions


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Daisy Chain
  Multiple devices that are connected in series. The output of the first device is connected to the input of the next device.
Source: Xilinx
Damage Threshold
  The maximum energy density to which an optical surface may be subjected without failure.
Source: JML Optical Industries, Inc.
Damped Wave
  A sinusoidal wave in which the amplitude steadily decreases with time. Often associated with energy loss.
Source: Interface Bus
  Reduction in magnitude of oscillation due to energy being dissipated as heat.
Source: Twisted Pair
Darkfield Illumination
  An optical technique where the specimen is seen as a bright object against a dark background.
Source: FRT of America
Darlington Drive Output Current
  Darlington drive digital outputs are digital channels with higher current drive capability than typical digital channels. The Darlington drive output current specification indicates which ports have darlington drive capability. The specification also indicates the current the channel can source into a given resistance at a given voltage. The current is specified as a negative number to emphasize that current is being sourced by the DAQ product.
Source: National Instruments
Data Acquisition
  Gathering information from sources such as sensors and transducers.
Source: Test & Measurement World
  A circuit that can digitize and process the output of sensors or signals in order to monitor, analyze and/or control systems and processes. Data acquisition can also filter, amplify, and other processes sensor outputs so that they can be read by computers.
Source: A.T.E. Solutions, Inc.
Data Bus
  A bi-directional set of signals used by a computer to convey information from a memory location to the central processing unit and vice versa. More generally, a set of signals used to convey data between digital functions.
Source: Maxfield & Montrose Interactive Inc.
Data Circuit-terminating Equipment
  (DCE) - In a data station, the equipment that performs functions, such as signal conversion and coding, at the network end of the line between the data terminal equipment (DTE) and the line, and that may be a separate or an integral part of the DTE or of intermediate equipment. The interfacing equipment that may be required to couple the data terminal equipment (DTE) into a transmission circuit or channel and from a transmission circuit or channel into the DTE.
Source: Interface Bus
Data Extender
  Takes an input image of lower resolution and creates one of higher resolution.
Source: Datacube
Data Eye
  A representation of digital data, typically measured on an oscilloscope. Bits of 1s and 0s are super-imposed in one bit period.
Source: Ziad A. Matni of Inphi Corporation
Data Link Layer
  The OSI level that performs the assembly and transmission of data packets (gets data packets on and off the wire), does error detection and correction, synchronization and retransmission. It includes the Medium Access Control (MAC) & Logical Link Control (LLC). The LLC on the upper half, which does the error checking The MAC on the lower half, which deals with getting the data on and off the wire. The primary purpose of the Data Link Layer is to provide error-free transmission of information between two end stations "edge nodes" attached to the same physical cable or media. This then allows the next higher layer to assume virtually error-free transmission over the physical link. The Data Link Layer is responsible for packaging and placing data on the network media. It then manages how the flow process of the bit stream takes place.
Source: Xilinx
Data Logging
  The recording of selected information during a specified operation, such as data recorded during a device-test run.
Source: ATE World
Data Register Scan
  (DR scan) - A scan operation that includes shifting new data into test data registers from the TDI buffers and shifting captured data out into the TDO buffers while the TAP controller is in Shift-DR state. The test controller automatically shifts a number of bits equal to the combined length of the selected test data registers of all devices in the scan path.
Source: Texas Instruments
Data Transfer Rate
  The average number of bits, characters, or blocks per unit time passing between corresponding equipment in a data transmission system.
Source: Interface Bus
Data Transfers
  The methods available to transfer digitized data from the DAQ board to computer memory. Options for data transfer are DMA, interrupt, and programmed I/O. For programmed I/O transfers, the CPU in the PC reads data from the DAQ board whenever the CPU receives a software code to acquire a single data point. Interrupt data transfers occur when the DAQ board sends an interrupt to the CPU, telling the CPU to read the acquired data from the DAQ board. DMA transfers use a DMA controller instead of the CPU to move acquired data from the board into computer memory. Even though high-speed data transfers can occur with interrupt and programmed I/O transfers, they require the use of the CPU to transfer data. DMA transfers are able to acquire data at high speeds and keep the CPU free for performing other tasks at the same time.
Source: National Instruments
DC Accuracy
  The difference of the set-up voltage and actual output voltage.
Source: Tektronix
DC Fault Models
  Mathematical descriptions of faulty behavior designed to assess structural compliance of a circuit independent of any timing requirements -- the most common example is the gate-level stuck-at fault model.
Source: Inovys
DC Offset
  A constant voltage added to an input signal. DC-offset can vary with time, temperature and/or changes in corner-frequency settings.
Source: Frequency Devices, Inc.
DC Scan
  Form of scan where shifting and sampling occurs well below the devices normal operating frequency. This type of scan is effective for a 'pure' structural approach (i.e. for stuck-at faults) and, in general, timing performance cannot necessarily be verified with this type of scan.
Source: NPTest

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