A.T.E. Solutions Info
About Us
Contact Us
Site Map
Short Cuts
Online Store
Books on Test
Build a Test Library
Testability Director Software
Test Flow Simulator Software
Schedule of Courses
On-Site Courses
Test Requirements Analysis
TRD and TPS Development
Testability Consulting
BIST Consulting
ATE Market Consulting
Consultant Reports
BITES single-chip Built-In Tester
BestTest Directory
Test Calendar
Test Definitions
Articles on Test
Test Vendor Directory
Test Products and Services Directory

Test Definitions


Text Search:
All  A  B  C  D  E  F  G  H  I  J  K  L  M  N  O  P  Q  R  S  T  U  V  W  X  Y  Z 
    1 - 20
of 145 Records Found
Next » Last »|
I/O address
  The address of the GPIB board from the point of view of the CPU, as opposed to the GPIB address of the GPIB board. Also called port address or board address.
Source: National Instruments
I/O Buffer Information Specification
  (IBIS) - A standard simulation format used to model the behavior of an integrated circuit's input/output (I/O) pins. Used in designing and simulating the operation of circuit buses.
Source: EE Design
IC Tester
  A test equipment (usually an ATE) that tests integrated circuits (ICs). The scope of the test can vary from a simple exercise of the function, called DC parametric tests, to more elaborate time-related tests, called AC parametric tests.
Source: A.T.E. Solutions, Inc.
IC Voltage Regulator
  Three terminal device used to hold the output voltage of a power supply constant over a wide range of load variations.
Source: Twisted Pair
IDDQ Testing
  Direct drain quiescent current. A type of testing that relies on current measurements (as opposed to voltage) for observation to determine if a part is defective. A functional IC will have very low quiescent current, as opposed to a defective IC having a path from power to ground causing noticeably higher current.
Source: Mentor Graphics
IEEE 1149.1
  Boundary-Scan standard formed by JTAG, the IEEE 1149.1 standard committee.
Source: Hebrew University of Jerusalem "DFT & JTAG" Course
IEEE 1149.4 Mixed Signal Test Bus
  An IEEE standard that is a superset of the IEEE 1149.1 standard for boundary scan and includes analog test structures.
Source: IEEE
IEEE 1149.5 IEEE Standard for Module Test and Maintenance Bus (MTM-Bus) Protocol
  A system level application of boundary scan per IEEE 1149.1. The IEEE 1149.5 was withdrawn as a standard 6 February 2003.
Source: IEEE
IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks
  This standard augments IEEE Std 1149.1 to improve the ability for testing differential and/or ac-coupled interconnections between integrated circuits on circuit boards and systems.
Source: IEEE
IEEE 1394, FireWire, iLink
  IEEE-1394 (also refers to as i.LINK or FireWire) is a specification for data transfer between devices. It is the underlying network technology for the HAVi protocols as well as for the transport of the real-time AV streams. Serial protocol that runs at speeds ranging from 100 to 400 megabits per second, depending upon the implementation. Devices that are prime candidates for IEEE 1394 include digital camcorders and VCRs, digital audio amplifiers, and video teleconferencing. IEEE 1394 (FireWire or iLink) is a hardware and software standard for transporting data at 100, 200, 400, or 800 megabits per second (Mbps). IEEE 1394b will be capable of transporting data at 3.2 Gbps in 100 meter range.
Source: Xilinx
IEEE 1641-2004 IEEE Standard for Signal and Test Definition
  IEEE 1641 lets you define signals purely in terms of the LRU under test, which makes it easier to replace instruments in a test system and makes the system itself more resistant to obsolescence.
Source: IEEE
IEEE 802.11
  Wireless LAN (WLAN). The 802.11 committee standard for 1 - 40 Mbps wireless LANs. The standard has a single MAC layer for the following physical-layer technologies: Frequency Hopping Spread Spectrum, Direct Sequence Spread Spectrum, Orthogonal Frequency Division Multiplexing (OFDM) and Infrared. IEEE 802.11a is a wireless LAN standard for the 5GHz spectrum, based on OFDM. IEEE 802.11b is a wireless LAN standard for the 2.4GHz spectrum, based on Ethernet.
Source: Xilinx
IEEE P1149.7 or IEEE 1149.7
  A superset of 1149.1 and fully compliant with it, directed at reducing the pincount and enhancing the functionality of the link between 1149.1 test systems and targets.
Source: JTAG Technologies
IEEE P1581
  This working group is defining a standard protocol for testing the interconnection of low-cost, complex memory ICs where additional pins for testing are not available and implementation of boundary-scan within the memory ICs is not feasible.
Source: JTAG Technologies
  A communications standard bus adopted by IEEE in 1975 for communications between instruments in an automated test system.
Source: EE, December 2001
Illinois Scan
  A test compression method, generally delivering from 1X-11X compression, that involves applying a single scan input to multiple parallel subchains. This technique is used in SynTestís VirtualScan compression tool.
Source: Mentor Graphics
Image Analysis
  Process of generating a set of descriptors or features on which a decision about objects in an image is based.
Source: Coreco
Image Circle
  The circular image field over which image quality is acceptable; can be defined in terms of its angular subtense. Alternately known as circle of coverage .
Source: JML Optical
Image Processing
  Transformation of an input image into an output image with desired properties.
Source: Coreco
Imaginary Number
  (j) - The square root of -1 is called an imaginary number and is designated as j or i.
Source: A.T.E. Solutions, Inc.

    1 - 20
of 145 Records
Next » Last »|