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Test Definitions


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Object Oriented Programming
  A programming style that combines data blocks and the associated software processing algorithms into "encapsulated" modules with narrowly defined entry and exit points. This programming style was developed as a way of dealing with extremely large and complex software programming projects by breaking the project down into smaller chunks more easily handled by an individual programmer. The narrowly defined entry and exit points of each module prevent one programmer's module from disrupting another's.
Source: EE Design
Object Testing
  A testing method that inspects and verifies all of an objectís properties, including objects that are non-visible or non-visual. Object Testing lets you test objects that are specific to certain application development environments, Table Windows, Visual Basic objects, and OCX/ActiveXs.
Source: Master Test Engineer Glossary
  The optical element which receives light from the object and forms the first or primary image in telescopes, microscopes and other optical systems.
Source: JML Optical
Objective Lens
  Forms the primary image of the microscope which is seen through the eyepiece. The markings on the objective lens are the magnifying power (such as 10x), followed by the NA (0.25) and the tube length. Other numbers which appear on the objective lens may refer to the manufactures catalog number of the particular item.
Source: FRT of America
Oblique Ray
  A ray of light that is neither perpendicular nor parallel, but inclined.
Source: JML Optical
  The ability to observe nets, nodes, gates, or sequential elements after they have been driven to a known logic state. This has two main contexts in this text, the ability for an ATPG tool to drive fault effects to observe points in the design description during the vector generation; and the ability for a tester to observe expected response values of the chip internals at the package pins.
Source: Inovys
  The ability to observe values from internal nodes of the design at the chip-level.
Source: Mentor Graphics
  The ability to observe the result of faults within a circuit either directly or indirectly. Observability applies to chip, board and system levels.
Source: A.T.E. Solutions, Inc.
Occurrence of False Alarm
  The event when a test fails, yet there is no apparent failure.
Source: A.T.E. Solutions, Inc.
  Base-8 numbering system. Each octal digit can be directly mapped onto three binary digits, or bits. Legal octal digits are integers 0 through 7.
Source: Maxfield & Montrose Interactive Inc.
  Interval between two sounds whose fundamental frequencies differ by a ratio of 2 to 1. 440 Hz. is one octave above 220 Hz.
Source: Twisted Pair
  A doubling or halving, usually applied to frequency. A GAIN ROLL-OFF RATE of 6dB/octave defines a change of 6 dB for each doubling or halving of frequency. Note that 20 dB/decade is equivalent to 6 dB/octave.
Source: Frequency Devices, Inc.
Odd Field
  The odd numbered lines in a frame of interlaced video.
Source: Datacube
Off-line Testing
  The testing of an item with the item removed from its normal operational environment.
Source: MIL-STD-2165
  A value to be added to each pixel to increase or decrease the intensity value of all of the pixels in the image.
Source: Datacube
Offset Error or DC Offset Error
  The additional voltage level, specified in volts, that can be introduced in the input circuitry. If you think of the amplifier transfer function as the equation y = m (x + b1) +b2, thenb1 is the pregain offset error and b2 is the postgain offset error, where y is the output, x is the input, and m is the gain. A pregain offset error occurs before amplification and a post-gain offset error occurs after amplification. The pre-gain offset error will be amplified by the gain of the amplifier. The after-calibration specification shows the maximum offset that will occur when the board is calibrated properly. A before-calibration specification is also given so that you will know the worst-case error that can occur, even if the board is not calibrated. The before-calibration specification also includes the range of calibration of which the onboard circuitry is capable.
Source: National Instruments
Offset Null
  An op amp control pin used to eliminate the effects of internal component voltages on the output of the device.
Source: Twisted Pair
  (The Greek letter omega) - A unit of resistance measurement that follows Ohm's Law. According to Ohm's Law 1 Ohm =1 volt/1 Amp.
Source: A.T.E. Solutions, Inc.
  Device used to measure electrical resistance.
Source: Twisted Pair
Ohm's Law
  Relationship between voltage, current and resistance. Ohm's law states that current in a resistance varies in direct proportion to voltage applied and inversely proportional to resistance.
Source: Twisted Pair
Ohms per volt
  Refers to a value of ohms per volt of full scale defection for a moving coil meter movement. The number of ohms per volt is the reciprocal of the amount of current required to produce full scale deflection of the needle. A meter requiring 50 microamps for full scale deflection has an internal resistance of 20 kW per volt. The higher the ohms per volt rating, the more sensitive the meter.
Source: Twisted Pair
On-Chip Emulation
  (OnCE) - A Freescale JTAG command which makes a TAP enter a special mode where the IR holds OnCE debugging commands for operations such as single stepping, breakpointing, and accessing registers or memory.
Source: Wikipedia
One Shot
  See Monostable Multivibrator.
Source: A.T.E. Solutions, Inc.

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