BestTest Newsletter Index
Current Issues
Date Product/Service Focus - (You may add your own products any time even for future and past issues) Feature Article Advertisers

Sep 16, 2007

Diagnostic Tools

Boundary Scan Excels at Diagnosing BGA Faults

By Arden Bjerkeli,

Director of Customer Applications Support, ASSET InterTech, Inc.

Fast Silicon Bring-Up on the Desktop

By Stephan Pateras, Ph.D.,

Senior Director of Strategic Technology, LogicVision, Inc.

AutoTestCon 2007SMTA,   A.T.E. Solutions, Inc.

Sep 1, 2007

Digital Multimeters (DMMs)

A Modular Architecture for Precision DC Measurements

By

Travis White, Product Manager, National Instruments

AutoTestCon 2007SMTA,   A.T.E. Solutions, Inc.

Aug 16, 2007

Power Supply Automatic Test Equipment

What Are the Major Selection Criteria in Power Supply Testers?

By Paul Swartz,

President, and by the Applications Staff at NH Research, a leading supplier of power supply test equipment since 1981

Characterizing Power Supplies with an Oscilloscope

By Mike Hertz, LeCroy - from Electronic Products' Website

AutoTestCon 2007SMTA,   A.T.E. Solutions, Inc.

Aug 1, 2007

Bit Error Rate Testers

Gigabit Signal Integrity Creates New Challenges

By Guy Foster,

VP Outbound Marketing. SyntheSys Research Inc.

AutoTestCon 2007SMTA,   A.T.E. Solutions, Inc.

Jul 16, 2007

Functional Board Automatic Test Equipment

Multiple Test Strategies for Testing Today’s Complex Boards

By

S.R. Sabapathi, Technical Director and CEO of Qmax

Qmax, AutoTestCon 2007SMTA,   A.T.E. Solutions, Inc.

July 1, 2007

Interface Products

USB as Innovative Interface for Automotive Testing

By

Stefan Meisner, GOEPEL Electronics

AutoTestCon 2007SMTA,   A.T.E. Solutions, Inc.

Jun 16, 2007

Test and Tester Software

Test and Tester Software – Features and Technologies for Today’s ATE Systems

By Mike Dewey,

Sr. Product Manager, Geotest, Inc.

Reconfigurable Tester Resources for Extended JTAG/Boundary Scan Applications

By

Heiko Ehrenberg, Manager of US Operations, GOEPEL Electronics

AutoTestCon 2007SMTA,   A.T.E. Solutions, Inc.

Jun 1, 2007

Built-In Self Test

Adopting the Right Solution for Embedded Memory Test

By Steve Pateras

Sr. Director of Strategic Technology, LogicVision

Logic BIST Scheme for Intra-/Inter-clock-domain At-Speed Testing

By Ravi Apte, Ph.D.

VP Strategy and Business Development, SynTest Technologies, Inc.

 The Role of Memory Built-in Self Test and Built-in Self Diagnostics in Today's Overall Test Strategy

By Luigi Ternullo

Product Marketing Manager, STAR Memory System, Virage Logic Corporation

LogicVision, AutoTestCon 2007SMTA,   A.T.E. Solutions, Inc.

May 16, 2007

Boundary Scan Test

Design for Boundary Scan Testability Beyond Static Connectivity Tests

By

Heiko Ehrenberg, Manager of US Operations, GOEPEL Electronics

Boundary Scan Skews Test Coverage Tradeoffs in your Favor

By Arden Bjerkeli, Director of Customer Application Support, 
ASSET InterTech, Inc.

Using JTAG to Preserve Board Level IP

By

Dominic Plunkett, Chief Technology Officer, XJTAG, Ltd.

GOEPEL Electronics, Corelis, AutoTestCon 2007SMTA,   A.T.E. Solutions, Inc.

May 1, 2007

Design for Testability Tools

Design-for-Test Tool Would Ensure Maximum Benefit from JTAG

By Dave Bonnett, Technical Marketing Manager, ASSET Intertech, Inc.

Managing Testability - With Tools or Without

By Louis Y. Ungar, President, A.T.E. Solutions, Inc.

  SMTA,   A.T.E. Solutions, Inc.

Apr 16, 2007

Environmental Test

Environmental Test Using MIL-STD-810

 By Louis Y. Ungar, Editor-In-Chief, The BestTest Newsletter

  SMTA,   A.T.E. Solutions, Inc.

Apr 1, 2007

X-Ray Inspection Equipment

Complex Semiconductor Packages Increase the Need for 3-D X-Ray Inspection

By Paul Walter, Managing Director, Dage Precision Industries, Inc.

New Package Types Demand More from Automated X-Ray Inspection

By Stacy Johnson, AXI Product Manager, Agilent Technologies, Inc.

 Dage Inc., SMTA,   A.T.E. Solutions, Inc.

Mar 16, 2007

Oscilloscopes

The Winner of the Best Test Product of the Year is an Agilent Oscilloscope

 By Louis Y. Ungar, Editor-In-Chief, The BestTest Newsletter
Based on an Interview with Agilent Product Manager for the Design Validation Division, Takuya Furuta.

Real-Time Oscilloscopes Automate Jitter Test and Eye Diagram Measurements for High-Speed Serial Data Compliance Testing 

By Gregory Davis, Market Development Manager, Tektronix, Inc.

  SMTA,   A.T.E. Solutions, Inc.

Mar 1, 2007

Charting, Logging and Data Acquisition

Specifying Data Acquisition May Be More Involved Than You Thought

 By:  

Louis Y. Ungar, Editor, The BestTest Newsletter

  SMTA,   A.T.E. Solutions, Inc.

Feb 16, 2007

Military and Avionics ATE

How Military Testing Standards are Changing

 By:  

Asad Bajwa, MET Labs

  SMTA,   A.T.E. Solutions, Inc.

Feb 1, 2007

Sensors

Making Electric Field Measurements with E-Field Sensors

 By:  

Steve King, Technical Manager of Field Sensing, ETS-Lindgren

Measurement Science Conference, SMTA,   A.T.E. Solutions, Inc.

Jan 16, 2007

Memory Test

The State of Memory Testing

 By:  

Scott LaRoche, Sales Director, Innoventions, Inc. 

and

IEEE P1581 Offers Solutions for Board Level Memory Test Problems

By: Heiko Ehrenberg, GOEPEL Electronics USA

Measurement Science Conference, SMTA,   A.T.E. Solutions, Inc.

Jan 1, 2007

 

The Best of the Best Tests in 2006

By:  Louis Y. Ungar, Editor of The BestTest Newsletter

Measurement Science Conference, SMTA,   A.T.E. Solutions, Inc.

2006 Issues
Date Product/Service Focus - (You may add your own products any time even for future and past issues) Feature Article Advertisers

Dec 16, 2006

LXI Based Instruments

LXI, the "Next Generation" Replacement for GPIB

 By: Fred Bode, LXI Consortium Administrator and Executive Director (Retired)

Where is LAN / LXI Best used for Instrument Control?

 By:  Patrick Webb, Instrument Control Product Manager, National Instruments

Measurement Science Conference, SMTA,   A.T.E. Solutions, Inc.

Dec 1, 2006

IEEE-488 (GPIB) Based Instruments

GPIB (IEEE-488) Offers Advantages in Low-Latency Applications

 By:  Alex McCarthy, GPIB Product Manager, National Instruments

Measurement Science Conference, SMTA,   A.T.E. Solutions, Inc.

Nov 16, 2006

PXI Based Instruments

When to Choose PXI Instruments

 By: 

Mike Dewey, Marketing Product Manager, 
Geotest - Marvin Test Systems, Inc.

Why Customers Choose PXI

 By:  Murali Ravindran, PXI Product Manager, National Instruments

Measurement Science Conference, SMTA,   A.T.E. Solutions, Inc.

Nov 1, 2006

VXIbus Based Instruments

When to Choose VXI Based Instruments

 By:  Tom Sarfi
Business Development Mngr at VXI Technology Inc. and 
Current VXIbus Consortium President

SMTA,   A.T.E. Solutions, Inc.

Oct 16, 2006

DFT Scan Analyzers and Synthesizers

How to Select a Tool for Testability Analysis and Scan Insertion

 By: 

Rick Fisette, Technical Marketing Engineer, 
Mentor Graphics
Design-For-Test

International Test Conference 2006,   A.T.E. Solutions, Inc.

Oct 1, 2006

Noise Generators

Selecting a Noise Generator

 By: 

Patrick Robbins, Micronetics, Inc. - Enon Microwave and Noise Products Divisions

DoveBid, International Test Conference 2006,   A.T.E. Solutions, Inc.

Aug 16, 2006

USB Instrumentation

How to Select USB-based Instruments

 By:

Alan Lowne, Saelig Co. Inc.

AutoTestCon 2006, International Test Conference 2006,   A.T.E. Solutions, Inc.

Aug 1, 2006

Logic Analyzers

How to Select a Logic Analyzer for Under $1,000

 By:

Alan Lowne, Saelig Co. Inc.

AutoTestCon 2006, International Test Conference 2006,   A.T.E. Solutions, Inc.

July 16, 2006

Flying Probe Access

Considerations for Selecting Test Systems Using Flying Probe Access

 By: Louis Y. Ungar, Editor, The BestTest Newsletter

SMTA,   A.T.E. Solutions, Inc.

July 1, 2006

Boundary Scan Test

Boundary Scan Tools for Design Verification and Prototype Debug

 By:

Rick Folea, UniversalScan - Ricreations, Inc.

 You've Decided to Get Into Boundary Scan... Now What?

 By: Ray Dellecker, US Marketing Manager, JTAG Technologies

Ricreations, Inc., JTAG Technologies, Inc. SMTA,   A.T.E. Solutions, Inc.

June 16, 2006

LXI Bus

SMTA,   A.T.E. Solutions, Inc.

June 1, 2006

IC Automatic Test Equipment

 Alternatives to High Priced IC ATEs
By: Louis Y. Ungar, Editor, BestTest.com

SMTA,   A.T.E. Solutions, Inc.

May 16, 2006

Bus Analyzers

How to Select the Right Bus Analyzers and Controllers
By:
Alan Lowne, President - Saelig Co. Inc.

How to Select a Bus Analyzer
By: Bill Schuh, Director of Military Electronic Products, Condor Engineering

Considerations in Selecting a Bus Analyzer
By:
Nicole Renfro, Marketing Manager at VMETRO, Inc.

SMTA,   A.T.E. Solutions, Inc.

May 1, 2006

Frequency Synthesizers

Selecting and Purchasing Frequency Synthesizer Products
By:

Mike Harris, Director of Business Development, Meret Optical Communications

SMTA,   A.T.E. Solutions, Inc.

Apr 16, 2006

Electrostatic Discharge (ESD) Test Equipment

Finding your way around ESD Standards
By: 
Carl E. Newberg, President, MicroStat Laboratories

SMTA,   A.T.E. Solutions, Inc.

Apr 1, 2006

Diagnostic Tools

Selecting a Systems Diagnostic Design Development Tool
By: 

Craig De Paul, President, DSI International

Selecting the Best Technology For Troubleshooting No Fault Found / Intermittent Conditions
By: Brent Sorensen,President, Universal Synaptics

Diagnostic Tools Fit Specific Needs; Success Comes from Best Match-Ups
By: Tim Webb, DiagnoSYS Systems, Inc.

Diagnostic Tools using Automatic Probing
By: Jim Crosson , Huntron, Inc.

SMTA,   A.T.E. Solutions, Inc.

Mar 16, 2006

Automatic Optical Inspection

AOI as Part of a Winning Test Strategy
By: 

Don Miller, President of YESTech 

The Capability of AOI Systems – More than Just the Sum of their Parts
By: Jens Kokott, Team Manager, AOI Systems at GÖPEL electronic GmbH

SMTA,   A.T.E. Solutions, Inc.

Mar 1, 2006

Burn-In Products and Services

Dynamic Burn-In of High Pin Count Logic Devices with Monitoring Capability
By:

Stephen Tsun, Sales Manager, INCAL Technology

Optimize Your Burn-In Design
By: Randy Spivey, Randy@ceibis.com, VP Sales & Marketing, CEIBIS

 

SMTAMeasurement Science Conference, A.T.E. Solutions, Inc.

Feb 16, 2006

Optical Time Domain Reflectometers

How to Select an OTDR 
By:

Peter Schweiger, Agilent Technologies, Photonics Measurement Division

How to Choose an OTDR to Test and Troubleshoot LAN Infrastructure 
White Paper By: Harley Lang III, Product Marketing Manager, Fiber Products, Fluke Networks

SMTAMeasurement Science Conference, A.T.E. Solutions, Inc.

Feb 1, 2006

In-Circuit ATE

How to Select an In-Circuit Tester 
By:

Peter Reinhardt, President, REINHARDT System- und Messelectronic GmbH

SMTAAPEX 2006, Measurement Science Conference, A.T.E. Solutions, Inc.

Jan 16, 2006

Switching Products

How to Select the Right Switching Product 
By: Tee Sheffer,
President, Signametrics

Switching Basics in RF Applications 
By:

Bob Stasonis, Sales & Marketing Manager, Pickering Instruments

An Integrated High Power Switching Solution 
By: Jon Semancik,
Marketing Manage, VXI Technology, Inc.

SMTAAPEX 2006, Measurement Science Conference, A.T.E. Solutions, Inc.

2005 Issues
Date Product/Service Focus - (You may add your own products any time even for future and past issues) Feature Article Survey Question / BestTest Product Preview Advertisers

Dec 16, 2005

Power Supply Automatic Test Equipment

Happy Holidays and a Fault Free New Year  
By: Louis Y. Ungar, Editor, BestTest

Which of the following characteristics are important in you selection of a Power Supply ATE? (Check up to 3 choices.)

SMTAAPEX 2006, Measurement Science Conference, A.T.E. Solutions, Inc.

Dec 1, 2005

Environmental Test

How to Select the Right Environmental Test

By:

Chris Hanse Peterson, HALT/HASS Consultant, Angelantoni Industrie, S.p.A.

Learning the Thermal Shock Basics

 By: David Jung, Marketing Manager, ESPEC North America

Which of the following is the most important consideration in planning your environmental test?

SMTAAPEX 2006, Measurement Science Conference, A.T.E. Solutions, Inc.

Nov 16, 2005

Test Equipment Distributors

Buying Used Test Equipment

By: Jim Coker, Manager, TESLA

Check the main source for your test equipment

SMTAAPEX 2006, Measurement Science Conference, A.T.E. Solutions, Inc.

Nov 1, 2005

Automobile Test Systems

Engine Control Module Test System Selection

By: Jon Semancik, Marketing Manager, VXI Technology

How to select an Automobile Test System

 By: Manfred Schneider, GÖPEL electronic GmbH, Jena

Which of the following do you consider the most important selection criterion for automobile test systems?

VXI Technology, Inc. SMTAAPEX 2006, Measurement Science Conference, A.T.E. Solutions, Inc.

Oct 16, 2005

Calibration/Maintenance Services

Choosing a Calibration Service Provider

By: Anthony James, Norvada LLC

Which of the following is your most important selection criterion for calibration laboratories?

SMTAAPEX 2006, Measurement Science Conference, A.T.E. Solutions, Inc.

Oct 1, 2005

Arbitrary Waveform Generators

Selecting your Next AWG

 By: 

Joan Mercade, Application Engineer at Tektronix

Memory Management in Arbitrary Waveform Generators

 By: 

Arlene Meadows, Sales Manager, Tabor Electronics Ltd.

Sophisticated Arbitrary Waveform Generation Requires Sophisticated Hardware

 By: 

Angsuman Rudra, Director of Systems, Interactive Systems and Circuits (ICS) Ltd. (Part of Radstone Embedded Computing)
Which single criterion is most important to you in selecting an Arbitrary Waveform Gernerator?

SMTAAPEX 2006, Measurement Science Conference, A.T.E. Solutions, Inc.

Sep 16, 2005

Military and Avionics Automatic Test Equipment

AutoTestCon is Not Just for Military Testing Any More

 By: 

Louis Y. Ungar of BestTest interviewed some members of the AutoTestCon 2005 Staff
Which one of these conferences do you find most useful for test vendors and for test related information?

SMTAAutoTestCon 2005, Measurement Science Conference, A.T.E. Solutions, Inc.

Sep 1, 2005

Testing Services

How to Select the Right Vibration Testing Service?

 By: Wayne Tustin, Equipment Reliability Institute and Rick Smith, Wyle Laboratories, Inc.

How to Select the Right ATE Testing Service?

 By: Bert Horner, The Test Connection, Inc.

Check all the testing and test related services that your company purchases from an outside vendor.

SMTAAutoTestCon 2005, Measurement Science Conference, A.T.E. Solutions, Inc.

Aug 16, 2005

Bus-to-Bus Translation/Bridging

Introduction to Bridging Instrument  Buses

 By:

Louis Y. Ungar, President, A.T.E. Solutions, Inc. 
Which of the following bus pairs do you translate between?

SMTAAutoTestCon 2005, Measurement Science Conference, A.T.E. Solutions, Inc.

Aug 1, 2005

Boundary-Scan Products

Selecting a Boundary-scan Vendor:  Consider Your Production and Repair Needs

 By:

Steve Lee, Field Application Engineers, JTAG Technologies Inc.

 How to Select Boundary Scan Products Based on Software Capabilities

 By: Heiko Ehrenberg, GOEPEL Electronics, Austin, TX

How to Select the Right Boundary-Scan Products

 By: David Shapiro, Director, International Business at Corelis

Selecting a Boundary-scan System Requires Thoughtful Analysis

 By: Dave Bonnett, Technical Marketing Manager, ASSET InterTech

Check the top three features that would be important to you in selecting a boundary-scan tool

JTAG Technologies, Goepel, Universal ScanSMTAAutoTestCon 2005, Measurement Science Conference, A.T.E. Solutions, Inc.

Ju1 16, 2005

Oscilloscopes

Selecting the Right Oscilloscope

By: Jerry Murphy and Bob Witte, Agilent Technologies, Inc., Design Validation Division

Which single reason best describes why you would use an oscilloscope?

  SMTAAutoTestCon 2005, Measurement Science Conference, A.T.E. Solutions, Inc.

Ju1 1, 2005

Test and Tester Analysis Software

On-Chip Debug Provides Insight Into Complex CPUs

By: Craig Haller, Chief Engineer, Macraigor Systems LLC

Check all the test or tester software types listed below that you or your company purchases.

  SMTAAutoTestCon 2005, Measurement Science Conference, A.T.E. Solutions, Inc.

Jun 16, 2005

System Integrators

Common Criteria for Selecting your System Integrator
 (and Five Others you probably did not think of)

 By:

Corry Johnson, Vice President of Marketing, Symtx, Inc.

 and

How to Select the Right System Integrator for your Next Project

 By: Don Holley, VI Technology

Which single criterion would lead you to consider a System Integrator (SI) to build your automated test system?

Symtx, Inc., SMTAAutoTestCon 2005, Measurement Science Conference, A.T.E. Solutions, Inc.

Jun 1, 2005

Functional Board Automatic Test Equipment

To FBT or Not to FBT, That is the Question

By: Louis Y. Ungar, President, A.T.E. Solutions, Inc.

Of all the reasons to make functional board test (FBT) part of your test strategy, which is the single most important one for your application?

SMTAAutoTestCon 2005, Measurement Science Conference, A.T.E. Solutions, Inc.

May 16, 2005

Data Acquisition

Simple Advice for Selecting Data Acquisition Products

 By:

Anthony Nygren, Vice President of Marketing, Measurement Computing Corporation

 and

Realtime Signal Processing with a DSPCentric Data Acquisition Engine 

 By: Arun Menon, Product Marketing Manager, Dynamic Signal Analyzers, Data Physics Corporation

Which  parameters are most important in your selection of data acquisition?

Measurement Computing Corporation, SMTA, IEEE-NETC, Measurement Science Conference, AutoTestCon 2005, A.T.E. Solutions, Inc.

May 1, 2005

Failure Analysis Services

Selecting the Proper Failure Analysis Service: An Insider's Perspective 

By: Paul Lukaniec

Technical Service Manager for COMET North America

Which factor do you consider most important in selecting a Failure Analysis Service?

SMTA, IEEE-NETC, Measurement Science Conference, AutoTestCon 2005, A.T.E. Solutions, Inc.

Apr 16, 2005

Design for Testability Tools

Selecting a Design for Testability Tool 

By: Rajini Parameswaran

Test Engineering Consultant, A.T.E. Solutions, Inc.

Check each of the design for testability (DFT) tool types you have used.

SMTA, Measurement Science Conference, AutoTestCon 2005, A.T.E. Solutions, Inc.

Apr 1, 2005

Used Automatic Test Equipment

Pre-Owned ATE - A Viable Solution  

By: Bernie Bruner , Rocky Mountain Test Equipment

 and

Reconditioned Test Equipment as a Key Driver in Reducing Life Cycle Support Costs

By: Peter Ostrow, President and CEO of TestMart and NAVICPmart

 

What three (3) factors would you need to satisfy before you considered buying used test equipment or ATE?

SMTA, Measurement Science Conference, AutoTestCon 2005, A.T.E. Solutions, Inc.

Mar 16, 2005

Sensors

Selecting Accelerometer Sensors for Test Applications

By: Mark Mason, Endevco Application Group

Check all of the sensor types you are utilizing in your test instruments.

SMTA, Measurement Science Conference, AutoTestCon 2005, A.T.E. Solutions, Inc.

Mar 1, 2005

Telecommunications and Wireless Testing Services

Wireless Testing Services: What do they offer?

By: Louis Y. Ungar, Editor, BestTest

Which wireless or telecommunication testing services do you perform for your products?

BestTest Previews the Agilent Medalist i5000 In-Circuit ATE

SMTA, Measurement Science Conference, AutoTestCon 2005, A.T.E. Solutions, Inc.

Feb 16, 2005

Automatic Optical Inspection

Considerations When Evaluating Automatic Optical Inspection (AOI) Needs 

By: John Cosic, New Business Development Manager, View Engineering, Inc.

Which performance parameters are of major interest to you in selecting optical inspection equipment?

SMTA, Measurement Science Conference, A.T.E. Solutions, Inc.

Feb 1, 2005

Instrumentation Control Software

Important Selection Criteria when Considering Test Software Development Solutions

By: Bill Woltz, Applications Manager, Geotest - Marvin Test Systems, Inc.

and

Choosing the Right Bus for Instrument Control

By: Shelley Gretlein and Dany Cheij, Instrument Control Software Product Managers at National Instruments

For which of these instrument buses do you use control software? Check all that apply.

SMTA, Measurement Science Conference, A.T.E. Solutions, Inc.

Jan 16, 2005

Hipot Insulation Breakdown Testers

Selecting a Hipot Test and Tester 

by: Jim Richards, Marketing/Applications Engineer, QuadTech Inc.

Select three (3) of these Hipot test features as the most important to you.

SMTA, Measurement Science Conference, A.T.E. Solutions, Inc.

Jan 1, 2005

In-Circuit Board ATE

How to Select an In-Circuit Board Automatic Test Equipment (ATE)

by John Van Newkirk, President, CheckSum

Check the top three features of an In-Circuit board tester that you find most important.

SMTA, Measurement Science Conference, A.T.E. Solutions, Inc.

2004 Issues
Date Product/Service Focus - (You may add your own products any time even for future and past issues) Feature Article Survey Question / BestTest Product Preview Advertisers

Dec 16, 2004

Product Safety Testing

Electrical Product Safety Resources by Arthur E. Michael Principal of Product Safety International

Check each of the following standards organizations whose safety tests you perform.

SMTA, Measurement Science Conference, A.T.E. Solutions, Inc.

Dec 1, 2004

Built-In Self Test

Planning for Built-In Self Test (BIST) to Handle your Testing Needs by Doug Goodman of Ridgetop Group, Inc., Jay Jahangiri of Mentor Graphics, CJ Clark of Intellitech Corporation, and Louis Y. Ungar of A.T.E. Solutions, Inc.

Which of these Built-In Self Test (BIST) approaches have you used?

Mentor Graphics, SMTA, A.T.E. Solutions, Inc.

Nov 16, 2004

Electrostatic Discharge (ESD) Test Equipment

How to Choose ESD Test Equipment by Vladimir Kraz, Credence Technologies

Check each of the following ESD features that you have in place in your plant.

SMTA, A.T.E. Solutions, Inc.

Nov 1, 2004

Automatic Test Equipment for Mixed Signal ICs

What Parameters Should One Look for When Buying Mixed-Signal ATE? by Gordon DeWitte of Agilent Technologies, Inc.

"Mixed-signal" is a term we use for electronics that have both digital and analog signals. Please check below all the type of non-digital signal types you need to test.

SMTA, A.T.E. Solutions, Inc.

Oct 16, 2004 Bit Error Rate Testers Selecting the Right Bit Error Rate Tester (BERT) by Guy Foster, of SyntheSys Research Inc.    When selecting a Bit Error Rate Tester (BERT) which criteria are most important to you? SyntheSys Research Inc., SMTA, A.T.E. Solutions, Inc.
Oct 1, 2004 Design Verification and Analysis Software Disappointments in Test by Louis Y. Ungar, Editor of BestTest Which of the following would be your preference with regards to The BestTest Newsletter? Check boxes you favor. SMTA, A.T.E. Solutions, Inc.
Sep 1, 2004 EMI Test Equipment EMI Test Plan for Frequency Hopping Receivers by Dr. William Duff, EMC Instructor Which of the following group of EMI/EMC standards do you test to? SMTA, AutoTestCon, Wescon, A.T.E. Solutions, Inc.
Aug 16, 2004 Memory Automatic Test Equipment  How to Select a Memory Tester by Scott LaRoche, Sales & Marketing Director, Innoventions, Inc. No survey in this issue. SMTA, AutoTestCon, A.T.E. Solutions, Inc.
Aug 1, 2004 Test Programming Services  Selecting a Test Programming Service by Louis Y. Ungar, President, A.T.E. Solutions, Inc. Which is the most important selection criterion in selecting a Test Programming Service? SMTA, AutoTestCon, A.T.E. Solutions, Inc.
Jul 16, 2004 Automobile Test Systems Automatic Test Equipment Not Your Father’s Automobile – Testing the Increasingly Complex Automotive Electronics by Bob Stasonis, Sales & Marketing Director, Pickering Interfaces What is the biggest problem for you in testing Automotive Electronic Control Units? SMTA, AutoTestCon, A.T.E. Solutions, Inc.
Jul 1, 2004 RF/Microwave and Wireless Communications Test Equipment

How should we test RF/Microwave Wireless Equipment? by Louis Y. Ungar, Editor, The BestTest Newsletter

Which of the following instrument types do you use in testing RF/Microwave Wireless products? SMTA, AutoTestCon, A.T.E. Solutions, Inc.

June 16, 2004

X-Ray Inspection Equipment

Selecting an X-ray Inspection System by Jon C. Dupree, Sales Manager and SMT Product Specialist, FEINFOCUS

Which of these considerations would most likely convince you to include X-ray inspection as part of your test strategy?

A.T.E. Solutions, Inc.

June 1, 2004 Digital Multimeters (DMMs).

Choosing a Digital Multimeter by Paul Lantz, VP Engineering, Signametrics Corp.

Digital Multimeters (DMMs) are generally used to measure resistances and voltages. What other measurements do you regularly make with your DMMs? A.T.E. Solutions, Inc.
May 16, 2004 Flying Probe Testers

Flying Probe Testers in Production by Dr. Grant Boctor, President of Digitaltest GmbH

Flying probe methods are used for several different types of generic Automatic Test Equipment (ATE). For which one of these test methods would you most likely want to use a flying probe access? A.T.E. Solutions, Inc.
May 1, 2004 Switching and Interface Products

Selecting Switching Products by Jeffrey Lum, President of ASCOR, Inc.

Which of the following switching characteristics of your Automatic Test Equipment (or desired ATE) you know well enough to specify? A.T.E. Solutions, Inc.
Apr 16, 2004 Boundary-Scan Test

How to Select a Boundary-Scan Board Test Tool by Ben Bennetts  of Bennetts Associates

Listed below are considerations in deciding to use or not use boundary-scan (JTAG/IEEE-1149.1). Some of these reasons are valid, others are not. Check all the reasons your company has taken into considerations in deciding to use, or not to use, this technology. JTAG Technologies, Gopel, Acculogic, Intellitech, A.T.E. Solutions, Inc.

Apr 1, 2004

Calibration Equipment

How Best to Select Calibration Equipment by Major L. Fecteau, US Army Product Manager for Test, Measurement and Diagnostic Equipment

Which of the following is the most stringent Test Uncertainty Ratio you use in your measurements?

A.T.E. Solutions, Inc.

Mar 16, 2004 Bare Board Automatic Test Equipment

The importance of the correct choice in Bare Board ATEs by Gianotti Nicoletta, Seica SpA, ITALY

Check all the following access methods that your board test operation utilizes. A.T.E. Solutions, Inc.
Mar 1, 2004 Temperature Measuring Equipment

Choosing a Cost-Effective Thermal Imager by Fernando Lisboa, Worldwide Director of Marketing & Product Development, Raytek

Check all the temperature measurements you make. Northcon, A.T.E. Solutions, Inc.
Feb 16, 2004 Test Fixtures and Probes Considerations in Selecting Instrument Probes by  Dick Press, President, Probe Master, Inc. Which of the following approximate probe widths do you use in your test fixtures? A.T.E. Solutions, Inc.
Feb 1, 2004 Power Supplu Automatic Test Equipment

Are Smart Power Supplies Nourishing Food for Thought About Functional Testing? by Jim Pennington, Applications Engineering Manager- AUTOTEST Company

Digital circuits are now available at various voltage levels. Check below each of the nominal voltage levels that you are using in your digital circuits. A.T.E. Solutions, Inc.
Jan 16, 2004 PXI

PXI Selection and Integration Guidelines by Loofie Gutterman, President, Geotest Inc.

For your next equipment purchase, check which configuration you prefer for each equipment type. A.T.E. Solutions, Inc.
Jan 2, 2004 Measuring Equipment. A New Concept in Test Information Exchange by Louis Y. Ungar, A.T.E. Solutions, Inc. Which of the following measurement resolutions do you generally utilize for your digital multimeter (DMM) measurements? A.T.E. Solutions, Inc.
2003 Issues
Date Product/Service Focus - (You may add your own products any time even for future and past issues) Feature Article Survey Question / BestTest Product Preview Advertisers
Dec 16, 2003 Environmental Test Equipment Selecting Environmental Test Equipment by Wayne Tustin Which of the following environmental tests do you use in your organization? A.T.E. Solutions, Inc.
Dec 1, 2003 Military and Avionics Automatic Test Equipment

Selecting Military ATE by Robert A. Lessmann, WesTest Engineering Corp

Military and avionics ATE is becoming obsolete, requiring replacement and rehosting of test program sets (TPSs) consisting of Test Programs, Interfaces and Documentation. UCLA Extension, A.T.E. Solutions, Inc.
Nov 16, 2003 Testability and Built-In Test Products/Services Digital Evolution by Dr. Alexander Miczo Which of the following test technologies do you anticipate will have the greatest impact in the way we test in 2004? UCLA Extension, A.T.E. Solutions, Inc.
Nov 1, 2003 IC Automatic Test Equipment Incoming Inspection of Components - Does it Make Sense? by Louis Y. Ungar, A.T.E. Solutions, Inc. In your opinion, which is the most compelling reason for NOT taking advantage of what is often called a (Design for Test) “DFT ATE.” A.T.E. Solutions, Inc.
Oct 16, 2003 Inspection Equipment Inspection Equipment Basics by Louis Y. Ungar, A.T.E. Solutions, Inc. There are a number of competing methods, all of which hope to increase the economic benefits of test. In your opinion, which of the following factors will have the greatest impact in improving the economic benefits gained from test? A.T.E. Solutions, Inc.
Oct 1, 2003 Cable Automatic Test Equipment What and Why The BestTest Newsletter?  by Louis Y. Ungar, A.T.E. Solutions, Inc. The economy has affected the test industry severely. In your opinion, which of the following test products or services will NOT experience a recovery and will be phased out completely? A.T.E. Solutions, Inc.

Upcoming Issues

Date Product/Service Focus - (You may add your own products any time even for past and future issues) Interested in Contributing an article or Advertising?
Oct 1, 2007 In-Circuit Board ATE Check Choices, write or call 310-641-8400
Oct 16, 2007 EMI/EMC Test Equipment Check Choices, write or call 310-641-8400
Nov 1, 2007 IEEE-488 (GPIB) Based Instruments Check Choices, write or call 310-641-8400
Nov 16, 2007 PXI Based Instruments Check Choices, write or call 310-641-8400
Dec 1, 2007 VXIbus Based Instruments Check Choices, write or call 310-641-8400
Dec 16, 2007 LXI Based Instruments Check Choices, write or call 310-641-8400
Jan 1, 2008 The Best of the 2007 BestTest Check Choices, write or call 310-641-8400
Jan 16, 2008 IC Test Check Choices, write or call 310-641-8400
Feb 1, 2008 - Open to Suggestion - Check Choices, write or call 310-641-8400
Feb 16, 2008 - Open to Suggestion - Check Choices, write or call 310-641-8400
Mar 1, 2008 - Open to Suggestion - Check Choices, write or call 310-641-8400
Mar 16, 2008 - Open to Suggestion - Check Choices, write or call 310-641-8400
Apr 1, 2008 - Open to Suggestion - Check Choices, write or call 310-641-8400
Apr 16, 2008 - Open to Suggestion - Check Choices, write or call 310-641-8400

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