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ATE Test Programming

ATE Test Programming
  ATE Test Programming 

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What you will learn: 

This course will teach you what is involved in developing a test program for an ATE. If you have never written a test program before, the course will illustrate the difficulties and point out traps that can make test programming a nightmare. For those who have experienced these problems, the course will provide a structured approach that will help avoid these problems in the future.

Abstract: 

This course provides a structured approach to the development of test programs. Through a non-trivial, but easy to understand example, participants learn how to develop the various planning stages of functional board test program. The lessons learned will apply to systems and IC level tests as well as to board level tests, including In-Circuit.

Who should Attend: 

Anyone who works with ATE will need to understand what is involved in test program development. Understanding of basic digital circuits is needed to follow the examples in class.

COURSE OUTLINE:

IC and Component Testing

  • Parametrics Testing
  • Combinational Circuit Testing
  • Sequential Circuit Testing
  • Testing Programmable Logic
  • LSI, VLSI Testing

Functional Board Testing

  • Stuck-at Fault Models
  • Fault Detection
  • Fault Isolation
  • Path Sensitization

Boundary-Scan Board Testing

  • Introduction to Boundary-Scan and the (JTAG) IEEE-1149.1
  • Automated Boundary-Scan Tests
  • Cluster Testing with Boundary-Scan
  • Functional Testing with Boundary-Scan
  • Boundary-Scan and BIST

Simulation

  • The Simulation Model
  • Good Circuit Simulation vs. Fault Simulation
  • Fault Scoring
  • Guided Fault Probing
  • Fault Dictionary

Analysis Before Coding

  • Testability Concerns
  • Timing Considerations
  • Bus Considerations

Interfacing

  • Mechanical Interfacing
  • Electrical Interfacing
  • Test Adapter Design
  • Test Adapter Test

The Test Strategy Report (TSR)

  • Why we need TSRs?
  • Contents of the TSR
  • TSR Review Process

Example Test Program

Automatic Test Pattern Generation (ATPG)

  • When is ATPG useful?
  • ATPG Techniques
  • Limitations of ATPG

ATE Languages

  • Characteristics
  • Standardization
  • ATLAS
  • ATE Language Translation

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