HiSPINOUT

HiSPINOUT, a new paradigm in testing digital high-speed I/O

High SPeed INput/OUtput Tester (Hi-SPINOUT) operates as an automatic test equipment (ATE) that performs tests on high-speed input/output ports and buses to find manufacturing and in-use defects on circuit boards and systems.  It can also be configured as an auxiliary test instrument and communicate with any other ATE over a serial bus.  It includes a complete and easy to run test program set (TPS) that also locates and diagnoses the source of the defect or failure. HiSPINOUT can be connected to military ATE – such as eCASS, VDATS and IFTE – and used as an integral part of a line replaceable unit (LRU) TPS.  Currently, HiSPINOUT tests the USB 3.0 bus. Other high-speed (or low speed) bus testing applications, as they become available, can be run on the same HiSPINOUT hardware platform.

HiSPINOUT Description

  • HiSPINOUT is a novel automatic test equipment (ATE) approach to test high-speed I/O buses on circuit boards and systems, using FPGA-based reconfigurable synthetic instruments
  • From the users’ perspective, HiSPINOUT offers a way to test complex high-speed buses, such as the USB 3.0 (USB 3.1 Gen 1) in an easy to run plug-and play mode.
  • There is no need for test program development – we have already done that for you!
  • It is easy to operate Hi-SPINOUT’s end-to-end test by anyone with easy-to-follow instructions (See HiSPINOUT Test Flow’s left branch)
  • Individual tests can be run by technical personnel to make signal integrity decisions (See HiSPINOUT Test Flow’s right branch)
  • HiSPINOUT can connect to your In-Circuit or Functional ATE, including military ATE and used as an auxiliary test instrument, providing high-speed test capability even to legacy ATE.
  • You can benefit from HiSPINOUT
    • If you manufacture circuit boards, you can now fully test the I/O integrity even during in-circuit test, saving you from a complex fault finding later, at a higher cost
    • Detecting and eliminating defects before the product matures and increases in cost, can save millions
    • In support/repair testing complex high-speed signals at-speed gives you the best way to judge signal integrity viewed on an eye diagram, allowing you to spot early degradation

HiSPINOUT Test Flow

View and download the HiSPINOUT Specification here