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Let our experts help with your test, ATE , Design for Testability and Built -in Self Test projects.
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We can teach test related courses at your facility or at ours—or on the internet. Many choices.
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We can put together a team with expertise for your ATE and test programming anywhere.
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We sell some of our solutions on DFT, BIST and test strategies. We also have full test sets.
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Announcements About Us
Important Reminders About Us:
Webinar: DFT for non-test engineers
***FREE due to COVID-19***
The unique webinar, entitled “Design for Testability (DFT) and Built-In Self Test (BIST): Not only for Test Engineers” will be presented twice on May 26, 2020 at 9:00 AM Pacific Time for the Americas, Europe and Africa and at 9:00 PM Pacific Time (Noon in Singapore on May 27, 2020) for an Asia. It is a great opportunity for designers, managers, quality assurance and manufacturing people – regardless of technical background – to learn what DFT and BIST really mean. Test engineers are also welcome but the webinar attendees need not have background in test, or in electronics for that matter, to follow the material we especially developed for this course. Register now, here for 9 AM Pacific.
Register now, here for 9 PM Pacific.
Distinguished Committee Service Award
Louis Ungar will be receiving the Distinguished Committee Service Award at IPC APEX EXPO 2019 on January 28, 2019 “in recognition of … outstanding contributions towards the development of the IPC-2231, DFX Guideline.” DFX is Design for eXcellence that includes Design for Testability, a section of the DFX Guidelinew which Mr. Ungar helped create.
Our next Publicly Held course, Design for Testability and for Built-In Self Test, in Los Angeles, CA
We have successfully demonstrated our High-Speed I/O Test solution to the US Navy with the USB 3.0 tested at 5 Gbps.
We are continuing our Design for Testability (DFT) effort towards the IPC’s Design for eXcellence (DFX) standard, IPC-2231
We are also involved with developing IEEE analog test standards P1687.2, P2427 and the system level test access management (STAM) standard P2654
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